联系人: 孟庆阳
电话: 021-20685476
主要仪器参数：
Electron Gun: W-hairpin
Acc. Vol. : 0.5 kV to 20 kV
SEI Resolution: 4 nm at 20 kV
5 nm at 20 kV (LV Mode)
Magnification: ×8 ~ × 300,000
Probe current: 1 pA ~ 0.3 A
Vacuum range: 10 ~ 100 Pa (LV mode)
Stage Movement: 5 axis (X,Y: Motorised)
EDS: JEOL SDD system (10mm2 )
Detectable elements: B ~ U
Energy Resolution: 133eV @Mn Kα
JSM-6010 PLUS is a powerful imaging technique widely used to observe the surface morphology and microstructure of solid samples with high resolution and a large depth of field. By scanning a focused electron beam across the sample, it generates detailed topographical images and can be equipped with accessories (such as EDS) for elemental composition analysis. It is an essential tool in materials science, biology, engineering, and nanotechnology for characterizing features ranging from micrometers to nanometers.
