JEM-2100 Plus 透射电子显微镜

发布者:朱海音发布时间:2022-04-13浏览次数:551

联系人马后逾

电话: 021-20684755

邮箱mahy2@shanghaitech.edu.cn


GUN:      LaB6

Resolution:  TEM dot 0.19nm,  lattice 0.14nm, STEM DF ~ 1nm

Magnification: ×3,000  ~ × 2,500,000

STEM:      JEOL STEM system

Detector:    HAADF Detector

EDS:       Oxford X-MAX N 100 TLE , Energy resolution 133eV

Chamber Camera: JEOL high Sensitive CMOS CAMERA (FLASH CAMERA) 

Bottom mount TVIPS CCD:    TemCam-XF416

Camera length: Extension up to 3,500mm

Image area:   63.5 × 63.5 mm² (16M pixel),

            High sensitivity

            High acquisition speed with large dynamic range.