联系人: 李玉真 021-20685793
邮箱: liyzh1@shanghaitech.edu.cn
HRTEM，STEM-HAADF/ABF，可获得高分辨原子像、电子衍射，材料成分及元素分布，配有二次电子探头可以同时获得样品表面形貌像
主要参数：
Electron-Gun: Schottky Electron Gun
Brightness: ≧4 × 108 A/cm2 sr (at 200 kV)
Pole Piece: HR Pole-Piece (f=2.3mm, Cs=1.0mm, Cc= 1.4mm)
Acc. Vol. : 200kV, 80kV
Resolution: TEM Point 0.23nm, TEM Lattice 0.1nm
STEM DF 0.19nm
Magnification: × 4,000 – ×2,000,000 (Mag mode)
Probe Current @200kV: 2.5 nA at 1.0 nm
Camera length: 15cm to 350cm
Bottom Camera : Gatan Rio 1816 (IS)
EDS: JEOL SDD system (100mm2 x1)
Solid Angle: 1sr
Resolution (FWHM):133 eV (at 55Fe, 5.9 keV, 1,000 cps)
Detectable element range: B to U
Bottom Camera : Gatan Rio 1816 (IS)
