JIB-4700F聚焦离子束FIB

发布者:朱海音发布时间:2022-04-13浏览次数:434


联系人: 朱海音 021-20685333  孟庆阳 021-20685476

仪器参数:

GUN:  In-lens Schottky Electron Gun

Lens system:  Hybrid Lens/HL 

                      GB (Gentle Beam Mode)

Detector:     LED, USD, UED, RBED                  

SEM Resolution:  1.2nm  @ 15 kV  with GB

  3.0nm  @ 0.1kV with GB

FIB Resolution:  4.0nm  @ 30kV

Image magnification:     ×50 to 300,000  (in FIB)

×20 to 1,000,000 (in SEM mode)

Acc. Voltage:  SEM mode 0.5 to 30.0 kV

  GB mode    0.1 to 29.9 kV

Beam current:  1pA to 300nA  (SEM)

1pA to 90nm     (Ion Beam)

Sample Transfer System: without exposing to air

Ex-situ Pick-up System

In-situ Oxford manipular

主要应用:TEM 超薄样品制备、微纳加工、截面分析、三维重构